Hostname: page-component-848d4c4894-xfwgj Total loading time: 0 Render date: 2024-07-06T04:27:37.362Z Has data issue: false hasContentIssue false

Focused Ion Beam Prepared Cross-Sectional Transmission Electron Microscopy Preparation On CaGe2 On Ge(111) Grown By Molecular Beam Epitaxy

Published online by Cambridge University Press:  04 August 2017

Robert E.A. Williams
Affiliation:
Center for Electron Microscopy and Microanalysis(CEMAS), The Ohio State University, Columbus, Ohio 43212, United States
Jinsong Xu
Affiliation:
Department of Physics, The Ohio State University, Columbus, Ohio 43210-1340, United States
Amanda Hanks
Affiliation:
Center for Electron Microscopy and Microanalysis(CEMAS), The Ohio State University, Columbus, Ohio 43212, United States
Adam Ahmed
Affiliation:
Department of Physics, The Ohio State University, Columbus, Ohio 43210-1340, United States
Igor V. Pinchuk
Affiliation:
Department of Physics, The Ohio State University, Columbus, Ohio 43210-1340, United States
Dave McComb
Affiliation:
Center for Electron Microscopy and Microanalysis(CEMAS), The Ohio State University, Columbus, Ohio 43212, United States
Roland Kawakami
Affiliation:
Department of Physics, The Ohio State University, Columbus, Ohio 43210-1340, United States
Jyoti Katoch
Affiliation:
Department of Physics, The Ohio State University, Columbus, Ohio 43210-1340, United States

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Copyright
© Microscopy Society of America 2017 

References

[1] Kato, Y., Myers, R. C., Gossard, A. C. & Awschalom, D. D. Nature 427(6969), 50 2004.CrossRefGoogle Scholar
[2] Kato, Y. K., Myers, R. C., Gossard, A. C. & Awschalom, D. D. Science 306(5703), 1910 2004.CrossRefGoogle Scholar
[3] Ophus, Colin, Ciston, Jim & Nelson, Chris T. Ultramicroscopy 162 2016 19.Google Scholar