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The Fluorescence Correction of Multilayer Materials for Quantitative X-ray Microanalysis

Published online by Cambridge University Press:  04 August 2017

Yu Yuan ,
Hendrix Demers  and
Raynald Gauvin
Yu Yuan
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada
Hendrix Demers
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada
Raynald Gauvin
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 218 - 219
Copyright
© Microscopy Society of America 2017 

References

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[2] Yuan, Y., et al, Microscopy and Microanalysis 2016). p. 400–401.CrossRefGoogle Scholar
[3] Gauvin, R. & Michaud, P. Microscopy and Microanalysis 15 2009 488–489.CrossRefGoogle Scholar
[4] Ritchie, N. W. Spectrum Simulation in DTSA-II, Microscopy and Microanalysis 15 2009 454–468.CrossRefGoogle Scholar