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Field Evaporation Behavior of Ternary Compound Semiconductor InxAli-xN

Published online by Cambridge University Press:  04 August 2017

Baishakhi Mazumder ,
Scott Broderick ,
Krishna Rajan ,
Joaquin Peralta ,
Humberto Foronda  and
James S. Speck
Baishakhi Mazumder
Affiliation:
Department of Materials Design and Innovation, University at Buffalo, Buffalo, NY, USA
Scott Broderick
Affiliation:
Department of Materials Design and Innovation, University at Buffalo, Buffalo, NY, USA
Krishna Rajan
Affiliation:
Department of Materials Design and Innovation, University at Buffalo, Buffalo, NY, USA
Joaquin Peralta
Affiliation:
Department Ciencias Fisicas, Universidad Andres Bello, Santiago, Chile
Humberto Foronda
Affiliation:
Materials Department, University of California, Santa Barbara, CA, USA
James S. Speck
Affiliation:
Materials Department, University of California, Santa Barbara, CA, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 636 - 637
Copyright
© Microscopy Society of America 2017 

References

[1] Vurgaftman, I., Ram-Mohan, L.R. & Meyer, J.R. J. Appl. Phys 89 2001). p. 5815.Google Scholar
[2] Kelly, T. F & Larson, D.J. Annual Review of Materials Research 42 2012). p. 1.CrossRefGoogle Scholar
[3] Mancini, L. The Journal of Physical Chemistry C 118 2014). p. 24136.Google Scholar
[4] Peralta, J., Broderick, S.R. & Rajan, K. Ultramicroscopy 132 2013). p. 143.CrossRefGoogle Scholar
[5] Loyola, C., Peralta, J., Broderick, S.R. & Rajan, K. J. Vacuum Sci. Tech. A 34 2016). p. 061404.Google Scholar