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FIB Clean Up of ToF-SIMS Craters for Microstructural Characterization

Published online by Cambridge University Press:  01 August 2010

VS Smentkowski  and
D Ellis
VS Smentkowski
Affiliation:
General Electric Company
D Ellis
Affiliation:
General Electric Company

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 238 - 239
Copyright
Copyright © Microscopy Society of America 2010