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Fast electron low dose tomography for beam sensitive materials

Published online by Cambridge University Press:  30 July 2021

Daniel Arenas Esteban
Affiliation:
Electron Microscopy for Materials Science (EMAT), University of Antwerp, 2020 Antwerp, Belgium, United States
Hans Vanrompay
Affiliation:
Electron Microscopy for Materials Science (EMAT), University of Antwerp, 2020 Antwerp, Belgium, United States
Alexander Skorikov
Affiliation:
Electron Microscopy for Materials Science (EMAT), University of Antwerp, 2020 Antwerp, Belgium, United States
Armand Béché
Affiliation:
Electron Microscopy for Materials Science (EMAT), University of Antwerp, 2020 Antwerp, Belgium, Belgium
Johan Verbeeck
Affiliation:
Electron Microscopy for Materials Science (EMAT), University of Antwerp, 2020 Antwerp, Belgium, United States
Bert Freitag
Affiliation:
Thermo Fisher Scientific, Achtseweg Noord 5, 5651 GG Eindhoven, The Netherlands, Eindhoven, Noord-Brabant, Netherlands
Sara Bals
Affiliation:
Electron Microscopy for Materials Science (EMAT), University of Antwerp, 2020 Antwerp, Belgium, United States

Abstract

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Type
Exploring Beam-sample Interactions for Uncovering the Atomic or Dynamic Nature of Matter
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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Fast versus conventional HAADF-STEM tomography of nanoparticles: advantages and challenges”. Vanrompay, H, Skorikov, A, Bladt, E, Béché, A, Freitag, B, Verbeeck, J, Bals, S, Ultramicroscopy 221, 113191 (2021).Google ScholarPubMed
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The authors would like to thank Professor Maarten Roeffaers for the provision of the samples.Google Scholar