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Exploiting Microreactors for Correlative Studies of Working Catalysts With Electrons And X-Rays

Published online by Cambridge University Press:  30 July 2021

Eric Stach ,
Alexandre Foucher ,
Nicholas Marcella ,
Anna Plonka ,
Ryan Tappero  and
Anatoly Frenkel
Eric Stach
Affiliation:
University of Pennsylvania, Philadelphia, Pennsylvania, United States
Alexandre Foucher
Affiliation:
University of Pennsylvania, Philadelphia, Pennsylvania, United States
Nicholas Marcella
Affiliation:
Stony Brook University, United States
Anna Plonka
Affiliation:
Stony Brook University, New York, United States
Ryan Tappero
Affiliation:
Brookhaven National Laboratory, Upton, New York, United States
Anatoly Frenkel
Affiliation:
Stony Brook University, Stony Brook, New York, United States

Abstract

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Type
Nanoscale x-ray and Electron Microscopy Techniques and Applications in Material Science
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 148 - 149
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Hannsen, T. W., & Wagner, J. B. (2016). Controlled atmosphere transmission electron microscopy. Springer.CrossRefGoogle Scholar
Li, Y., et al. Nature Comm. 6, 1-6, (2015).Google Scholar
Zhao, S., et al. J. Phys. Chem. C, 121, 18962-18972, (2017).CrossRefGoogle Scholar
Liu, D., et al. , ACS Catalysis 8, 4120-4131, (2018).Google Scholar
Gorelik, T.E., et al. , Acta Cryst., B75, 532–549, (2019).Google Scholar
This work was supported as part of the IMASC, an Energy Frontier Research Center funded by the U.S. Department of Energy, Office of Science, Basic Energy Sciences under Award # DE-SC0012573. This research used the XFM Beamline at the National Synchrotron Light Source II, a U.S. Department of Energy (DOE) Office of Science User Facility operated for the DOE Office of Science by Brookhaven National Laboratory under Contract No. DE-SC0012704. This work was carried out in part at the Singh Center for Nanotechnology at the University of Pennsylvania which is supported by the National Science Foundation (NSF) National Nanotechnology Coordinated Infrastructure Program grant NNCI-1542153. Additional support to the Nanoscale Characterization Facility at the Singh Center by the University of Pennsylvania Materials Research Science and Engineering Center (MRSEC) supported by the National Science Foundation (DMR-1720530) is acknowledged.Google Scholar