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Exploitation of Contrasts in Low Energy SEM to Reveal True Microstructure

Published online by Cambridge University Press:  27 August 2014

Ilona Müllerová
Affiliation:
Department of Electron Microscopy, Institute of Scientific Instruments ASCR v.v.i., Brno, Czech Republic
Šárka Mikmeková
Affiliation:
Department of Electron Microscopy, Institute of Scientific Instruments ASCR v.v.i., Brno, Czech Republic
Eliška Mikmeková
Affiliation:
Department of Electron Microscopy, Institute of Scientific Instruments ASCR v.v.i., Brno, Czech Republic
Zuzana Pokorná
Affiliation:
Department of Electron Microscopy, Institute of Scientific Instruments ASCR v.v.i., Brno, Czech Republic
Luděk Frank
Affiliation:
Department of Electron Microscopy, Institute of Scientific Instruments ASCR v.v.i., Brno, Czech Republic
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Abstract

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Copyright © Microscopy Society of America 2014 

References

[1] Müllerová, I, Frank, L Advances in Imaging and Electron Physics 128 (2003), p. 309.
[2] Müllerová, I, et al, Microscopy and Microanalysis 19, S2, (2013), p. 1236.
[3] Pokorná, Z, et al, Applied Physics Letters 100 (2012), 261602.
[4] The authors acknowledge funding from the Technology Agency of the Czech Republic (Competence center Electron microscopy, no: TE01020118) and from the MEYS of the Czech Republic (LO1212) together with the European Commission (ALISI, no. CZ.1.05/2.1.00/01.0017).
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