Hostname: page-component-848d4c4894-nmvwc Total loading time: 0 Render date: 2024-06-20T05:50:10.514Z Has data issue: false hasContentIssue false
  • English
  • Français

Explaining the Magnetic Properties of Oxygen Deficient LSMO Thin Films by iDPC

Published online by Cambridge University Press:  05 August 2019

Aubrey N. Penn ,
Robbyn Trappen ,
Navid Mottaghi ,
Chih-Yeh Huang ,
Abinash Kumar ,
Mikel Holcomb  and
James M. LeBeau
Aubrey N. Penn
Affiliation:
Department of Materials Science & Engineering, North Carolina State University, Raleigh, NC, USA.
Robbyn Trappen
Affiliation:
Department of Physics & Astronomy, West Virginia University, Morgantown, WV, USA.
Navid Mottaghi
Affiliation:
Department of Physics & Astronomy, West Virginia University, Morgantown, WV, USA.
Chih-Yeh Huang
Affiliation:
Department of Physics & Astronomy, West Virginia University, Morgantown, WV, USA.
Abinash Kumar
Affiliation:
Department of Materials Science & Engineering, North Carolina State University, Raleigh, NC, USA.
Mikel Holcomb
Affiliation:
Department of Physics & Astronomy, West Virginia University, Morgantown, WV, USA.
James M. LeBeau*
Affiliation:
Department of Materials Science & Engineering, North Carolina State University, Raleigh, NC, USA.
*
*Corresponding author: jmlebeau@ncsu.edu

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Spectroscopy and Imaging of Nanostructured Low-Z Materials in the Electron Microscope
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1748 - 1749
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Jin, S., Tiefel, T. H., McCormack, M., et al. , Science 264 (1994) p. 413.Google Scholar
[2]Huijben, M., Martin, L. W., Chu, Y.-H., et al. , Physical Review B 78 (2008) p. 094413.Google Scholar
[3]Liao, Z., Huijben, M., Zhong, Z., et al. , Nature Materials 15 (2016) p. 425.Google Scholar
[4]Lazić, I., Bosch, E. G. T., Lazar, S., Ultramicroscopy 160 (2016) p. 265.Google Scholar
[5]Sang, X., LeBeau, J. M., Ultramicroscopy 138 (2014) p. 28.Google Scholar
[6]This work is supported by the National Science Foundation (DMR-1608656). The authors also acknowledge the Analytical Instrumentation Facility (AIF) at North Carolina State University, which is supported by the State of North Carolina and the National Science Foundation.Google Scholar