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Examination of the Structural Quality of InAsSbBi Epilayers using Cross Section Transmission Electron Microscopy

Published online by Cambridge University Press:  01 August 2018

Rajeev R. Kosireddy
Affiliation:
Center for Photonics Innovation & Engineering of Matter, Transport, and Energy, Arizona State University, Tempe, AZ
Stephen T. Schaefer
Affiliation:
Center for Photonics Innovation & Electrical, Computer, and Energy Engineering, Arizona State University, Tempe, AZ
Arvind J. Shalindar
Affiliation:
Center for Photonics Innovation & Electrical, Computer, and Energy Engineering, Arizona State University, Tempe, AZ
Preston T. Webster
Affiliation:
Center for Photonics Innovation & Electrical, Computer, and Energy Engineering, Arizona State University, Tempe, AZ Air Force Research Laboratory, Space Vehicles Directorate RVSWS, Kirtland Air Force Base, Albuquerque, NM
Shane R. Johnson
Affiliation:
Center for Photonics Innovation & Electrical, Computer, and Energy Engineering, Arizona State University, Tempe, AZ
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© Microscopy Society of America 2018 

References

[1] Webster, P. T., et al, Appl. Phys. Lett 111 2017 082104.CrossRefGoogle Scholar
[2] The authors gratefully acknowledge financial support through the National Science Foundation (NSF) award DMR-1410393 and the Air Force Office for Scientific Research (AFOSR) STTR Phase II grant FA9550-16-C-0021, as well as the use of facilities in the LeRoy Eyring Center for Solid State Science at Arizona State University.Google Scholar
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