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Examination of the Shape and Structure of (111)-oriented GaAs Tensile-Strained Quantum Dots using Transmission Electron Microscopy, Electron Energy Loss Spectroscopy, and Atom Probe Tomography

Published online by Cambridge University Press:  05 August 2019

Kevin A. Grossklaus ,
Christopher F. Schuck ,
Paul J. Simmonds  and
Thomas E. Vandervelde
Kevin A. Grossklaus*
Affiliation:
Department of Electrical and Computer Engineering, Tufts University, Medford, MA, USA.
Christopher F. Schuck
Affiliation:
Micron School of Materials Science & Engineering, Boise State University, Boise, ID, USA.
Paul J. Simmonds
Affiliation:
Micron School of Materials Science & Engineering, Boise State University, Boise, ID, USA. Department of Physics, Boise State University, Boise, ID, USA.
Thomas E. Vandervelde
Affiliation:
Department of Electrical and Computer Engineering, Tufts University, Medford, MA, USA.
*
*Corresponding author: kevin.grossklaus@tufts.edu

Abstract

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Type
Microscopy and Spectroscopy of Nanoscale Materials for Energy Applications
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2208 - 2209
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Yoffe, A.D., Adv. Phys. 50 (2001), 1-208.Google Scholar
[2]Yerino, C.D. et al. , Appl. Phys. Lett. 105 (2014), 251901.Google Scholar
[3]Schuck, C.F. et al. , J. Vac. Sci. Technol. B 36 (2018), 031803.Google Scholar
[4]The authors gratefully acknowledge support for this study from the National Science Foundation under NSF ECCS Grant No. 1806311 and NSF CAREER Grant No. 1555270. Microscopy was performed at the Center for Nanoscale Systems (CNS) at Harvard University, a member of the National Nanotechnology Coordinated Infrastructure Network (NNCI), which is supported by the National Science Foundation under NSF award No. 1541959.Google Scholar