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Evidence for Active Atomic Defects in Monolayer Hexagonal Boron Nitride

Published online by Cambridge University Press:  27 August 2014

Ovidiu Cretu ,
Yung-Chang Lin  and
Kazutomo Suenaga
Ovidiu Cretu
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), Nanotube Research Center, Central 5, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8565, Japan
Yung-Chang Lin
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), Nanotube Research Center, Central 5, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8565, Japan
Kazutomo Suenaga
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), Nanotube Research Center, Central 5, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8565, Japan

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1728 - 1729
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Cretu, O, Lin, Y-C, Suenaga, K Nano Lett. DOI: 10.1021/nl404735w (2014).Google Scholar
[2] This work was supported by a JST Research Acceleration program.Google Scholar