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Event-Driven 2D Detector for Digital Electron Imaging

Published online by Cambridge University Press:  02 July 2020

G. Y. Fan ,
E. Beuville ,
P. Datte ,
J-F. Beche ,
J. Millaud ,
M. H. Ellisman  and
N-H. Xuong
G. Y. Fan
Affiliation:
University of California San Diego, La Jolla, CA92093
E. Beuville
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, CA94720
P. Datte
Affiliation:
University of California San Diego, La Jolla, CA92093
J-F. Beche
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, CA94720
J. Millaud
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, CA94720
M. H. Ellisman
Affiliation:
University of California San Diego, La Jolla, CA92093
N-H. Xuong
Affiliation:
University of California San Diego, La Jolla, CA92093
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An event-driven 2D pixel array detector designed for protein crystallography is being tested to determine its suitability as a direct electron detector for digital imaging in electron microscopy. The detector prototype consists of an 8×8 pixel array with an 150 μm pitch. The device configuration is illustrated in Fig. 1. The detector module consists of a reverse-biased 300 μm thick monolithic silicon diode array which is bump-bonded to an Application Specific Integrated Circuit (ASIC) which instruments each diode in the array. Each pixel cell of the ASIC forms a pixel processor which consists of an amplifier, discriminator, prescalar and readout circuit.

When an incident electron enters the detector, a group of electron-hole pairs is created in the silicon. The detector bias of the diode array is such that holes are collected at the input to the amplifier where the signal is then amplified and shaped. When the output signal pulse height is greater than the discriminator threshold, the event is then registered in the prescalar, causing one count to be accumulated.

Type
Digital Microscopy–What are its Limits?
Information
Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 1089 - 1090
Copyright
Copyright © Microscopy Society of America 1997

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References

1.Beuville, E.et al, SPIE Conference Proceedings 2859 (1996) 85.10.1117/12.245126CrossRefGoogle Scholar
2.Spence, J. C. H. and Zuo, J. M., Rev. Sci. Instr. 59 (9) (1988) 2102.10.1063/1.1140039CrossRefGoogle Scholar
3.Aikens, R. S., Agard, D. A., and Sedat, J. W., Meth. Cell Biol. 29 (1989) 291.10.1016/S0091-679X(08)60199-5CrossRefGoogle Scholar
4.Herrmann, K.-H. and Liu, L.Optik 92 (2) (1992) 48.Google Scholar
5.Fan, G. Y. and Ellisman, M. H., Ultramicroscopy 52 (1993) 21.10.1016/0304-3991(93)90019-TCrossRefGoogle Scholar
6. This work is supported by NIH grants RR-10748, RR-01644 and RR-04050.Google Scholar