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Evaluation of Methods for Extracting Chemical Information from Eels Line-Spectra Across Interfaces

Published online by Cambridge University Press:  02 July 2020

D. Imhoff ,
T. Sikora ,
F. Pailloux ,
M. Tencé  and
C. Colliex
D. Imhoff
Affiliation:
Laboratoire de Physique des Solides (UMR 8502), Bât. 510, Université Paris-Sud, F 91405, Orsay
T. Sikora
Affiliation:
Laboratoire de Physique des Solides (UMR 8502), Bât. 510, Université Paris-Sud, F 91405, Orsay
F. Pailloux*
Affiliation:
Unité Mixte CNRS-Thalès (UMR 137), LCR-Domaine de Corbeville, F 91404, Orsay
M. Tencé
Affiliation:
Laboratoire de Physique des Solides (UMR 8502), Bât. 510, Université Paris-Sud, F 91405, Orsay
C. Colliex
Affiliation:
also at Laboratoire Aimé Cotton (UPR 3321), Bât. 505, Université Paris-Sud, F 91404, Orsay
*
*Thanks are due to JP. Contour
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Abstract

EELS fine structures on characteristic core edges are closely related to the bonding type and structural environment around the excited atoms. Consequently, they constitute useful hints for investigating the electronic properties at interfaces. One major difficulty then lies in the extraction of the information relevant to the involved atoms, from that due to neighbouring atoms on both sides of the selected interface seen end on by the impinging electrons. We have investigated possible ways to reach this goal, using the spectrum-line method, which consists in acquiring sequences of spectra at well defined increments (0.3 nm) while scanning a subnanometer electron probe (0.7 nm) across the interface. This approach constitutes one step forward with respect to the spatial-difference (SD) method which processes spectra acquired on two adjacent areas, one encompassing the interface, the other one on a reference area nearby. A normalized version (NSD) has been introduced to extend its field of application from grain boundaries to heterophase interfaces in order to enhance their specific ELNES contribution

Type
Quantitative Transmission Electron Microscopy of Interfaces (Organized by M. Rüehle, Y. Zhu and U. Dahmen)
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 296 - 297
Copyright
Copyright © Microscopy Society of America 2001

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