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Environment-Dependent Electron Beam Reduction of Rutile Nanocrystals at High Temperatures

Published online by Cambridge University Press:  05 August 2019

Aram Yoon  and
Jian-Min Zuo
Aram Yoon
Affiliation:
Materials Science and Engineering, University of Illinois at Urbana Champaign, Urbana, IL, USA. Fredrick Seitz Material Research Laboratory, University of Illinois at Urbana Champaign, Urbana, IL, USA
Jian-Min Zuo*
Affiliation:
Materials Science and Engineering, University of Illinois at Urbana Champaign, Urbana, IL, USA. Fredrick Seitz Material Research Laboratory, University of Illinois at Urbana Champaign, Urbana, IL, USA
*
*Corresponding author: jianzuo@illinois.edu

Abstract

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Type
Revealing the Fundamental Structure of Soft and Hard Matter by Minimizing Beam-Sample Interactions
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1680 - 1681
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Smith, DJ, McCartney, MR and Bursill, LA, Ultramicroscopy 23 (1987), p. 299.Google Scholar
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[3]McCartney, MR and Smith, DJ, Surface Science 250 (1991), p. 169.Google Scholar
[4]McMullan, G et al. , Ultramicroscopy 147 (2014), p. 156.Google Scholar
[5]Howe, JY et al. , Microscopy and Microanalysis 23 (2017), p. 66.Google Scholar
[6]Sediako, AD et al. , Energy & Fuels 33 (2019), p. 1582.Google Scholar
[7]Work supported by DOE BES (Grant No. DEFG02-01ER45923).Google Scholar