Hostname: page-component-5c6d5d7d68-txr5j Total loading time: 0 Render date: 2024-08-18T12:36:28.145Z Has data issue: false hasContentIssue false

Environmental Electron Microscopy: Electron Beam Effects in Electrochemistry

Published online by Cambridge University Press:  27 August 2014

Yin Liu
Affiliation:
Department of Materials Science and Engineering, University of Illinois Urbana Champaign, IL, 61801USA
Shen Dillon
Affiliation:
Department of Materials Science and Engineering, University of Illinois Urbana Champaign, IL, 61801USA

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Zheng, H., Smith, R. K., Jun, Y.-w., Kisielowski, C., Dahmen, U., Alivisatos, A. P. Science (2009), 324, (5932), 1309-1312.Google Scholar
[2] Williamson, M. J., Tromp, R. M., Vereecken, P. M., Hull, R., Ross, F. M. Nature Materials (2003), 2, (8), 532-536.Google Scholar
[3] Woehl, T. J., Evans, J. E., Arslan, L., Ristenpart, W. D., Browning, N. D. Acs Nano (2012), 6, (10),8599-8610.Google Scholar
[4] Liu, Y., Dillon, S. J. Chemical Communications (2014), 50(14 , 1761-1763.Google Scholar
[5] Sun, M., Liao, H.-G., Niu, K., Zheng, H. Sci Rep.2013), 3.Google Scholar
[6] Zeng, Z., Liang, W.-I., Liao, H.-G., Xin, H., Chu, Y.-H., Zheng, H. Nano Letters (2014.Google Scholar
[7] de Jonge, N., Peckys, D. B., Kremers, G. J., Piston, D. W. Proceedings of the National Academy of Sciences of the United States of America (2009), 106, (7), 2159-2164.Google Scholar
[8] Woehl, T. J., Jungjohann, K. L., Evans, J. E., Arslan, I., Ristenpart, W. D., Browning, N. D. Ultramicroscopy (2012.Google Scholar
[9] This work is supported by the National Science Foundation under Grant No. 1254406.Google Scholar