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Energy Resolution of Modern EDS Spectrometers: Is the current ISO standard definition outdated?

Published online by Cambridge University Press:  23 September 2015

Ralf Terborg  and
Meiken Falke
Ralf Terborg
Affiliation:
Bruker Nano GmbH, Am Studio 2D, 12489 Berlin, Germany
Meiken Falke
Affiliation:
Bruker Nano GmbH, Am Studio 2D, 12489 Berlin, Germany

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1483 - 1484
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] ISO 15632:2012.Google Scholar
[2] Alvisi, M, et al., Micosc. Microanal 12 (2006), p. 406.CrossRefGoogle Scholar
[3] http://www.rm-certificates.bam.de/en/certificates/layered_and_surface_materials/index.htm.Google Scholar
[4] Hodoroaba, V-D & Procop, M, Microsc. Microanal. 20 (2014), p. 1556.CrossRefGoogle Scholar