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Energy Filtering and Spectrum Imaging of Polymers

Published online by Cambridge University Press:  02 July 2020

A. Aitouchen ,
J. Taylor ,
P. Crozier  and
M. Libera
A. Aitouchen
Affiliation:
Dept. of Chem., Biochem., and Matls. Engr., Stevens Inst, of Tech., Hoboken, NJ07030
J. Taylor
Affiliation:
Dept. of Chem., Biochem., and Matls. Engr., Stevens Inst, of Tech., Hoboken, NJ07030
P. Crozier
Affiliation:
Center for Solid State Sciences, Arizona State University, Tempe, AZ
M. Libera
Affiliation:
Dept. of Chem., Biochem., and Matls. Engr., Stevens Inst, of Tech., Hoboken, NJ07030
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Chemical imaging of polymeric materials is attractive, because of the inherently poor contrast typically afforded by multiphase amorphous polymers in bright-field imaging techniques. Spectrum imaging and energy-filtering approaches are being increasing applied to polymeric materials (1,2, 3).

One recent example from the Stevens group using a Philips CM20 FEG TEM/STEM interfaced to an EmiSpec Vision data acquisition/control system and a Gatan 666 PEELS spectrometer is presented in figure 1. The specimen is a PVP sphere on a holey-carbon TEM grid. The specimen was cooled to approximately -125 °C in a single-tilt cryo stage. Drift correction was implemented by collecting HAADF STEM images from the sub-image region indicated by the dashed white box at periodic intervals. Based on an autocorrelation with the initial image, electronic shifts where imposed to correct for drift. A 3-D spectrum dataset was generated from the 70 x 70 pixel box around the polymer particle at an interpixel spacing of 5 nm and a pixel dwell time of 1.5 sec.

Type
Advances in Polymer Characterization
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 1116 - 1117
Copyright
Copyright © Microscopy Society of America

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References

References:

1.Hunt, J., Disko, M., Behal, S., and Leapman, R., Ultramicroscopy 58, 55–64 (1995).CrossRefGoogle Scholar
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6. This work is supported by the Army Research Office.Google Scholar