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Energy Filtered STEM Imaging at 30kV and Below - A New Window into the Nano-World?

Published online by Cambridge University Press:  04 August 2017

Takeshi Sunaoshi ,
Manabu Shirai ,
Satoshi Okada ,
Kazutoshi Kaji  and
Edgar Voelkl
Takeshi Sunaoshi
Affiliation:
Hitachi High-Technologies Corp., Application Development Department, Ibaraki, Japan.
Manabu Shirai
Affiliation:
Hitachi High-Technologies Corp., Application Development Department, Ibaraki, Japan.
Satoshi Okada
Affiliation:
Hitachi High-Technologies Corp., Electron Microscope Systems Design 1st Dept., Ibaraki, Japan.
Kazutoshi Kaji
Affiliation:
Hitachi High-Technologies Corp., Electron Microscope Systems Design 1st Dept., Ibaraki, Japan.
Edgar Voelkl
Affiliation:
Hitachi High Technologies America, NSD, Clarksburg, Maryland, USA.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1560 - 1561
Copyright
© Microscopy Society of America 2017 

References

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