Hostname: page-component-848d4c4894-xm8r8 Total loading time: 0 Render date: 2024-06-25T07:31:31.435Z Has data issue: false hasContentIssue false
  • English
  • Français

Energy filtered imaging in a FEG-SEM for enhanced dopant contrast

Published online by Cambridge University Press:  01 August 2002

C. Schönjahn ,
C.J. Humphreys  and
M. Glick
C. Schönjahn
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge CB2 3QZ, UK
C.J. Humphreys
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge CB2 3QZ, UK
M. Glick
Affiliation:
Marconi Labs, Gates Building, JJ Thomson Ave, Cambridge CB3 0FD, UK

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 718 - 719
Copyright
Copyright © Microscopy Society of America 2002