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Energy Dispersive X-ray Spectroscopic Analysis of Al-Cu-Fe Quasicrystalline Thin Film Layer

Published online by Cambridge University Press:  05 August 2019

Andrew Canter ,
Kira Smith ,
Andrew Baker ,
Helen Hampikian  and
Chunfei Li
Andrew Canter
Affiliation:
Clarion University, Clarion, PA, USA.
Kira Smith
Affiliation:
Clarion University, Clarion, PA, USA.
Andrew Baker
Affiliation:
Clarion University, Clarion, PA, USA.
Helen Hampikian
Affiliation:
Clarion University, Clarion, PA, USA.
Chunfei Li*
Affiliation:
Clarion University, Clarion, PA, USA.
*
*Corresponding author: cli@clarion.edu

Abstract

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Type
Spectroscopy and Imaging of Nanostructured Low-Z Materials in the Electron Microscope
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1798 - 1799
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Goldman, AI and Widom, M, Annual Review of Physical Chemistry 42 (1991), p. 685.Google Scholar
[2]Balzuweit, K et al. , Philosophical Magazine B 67 (1993), p. 513.Google Scholar
[3]Ritchie, N, Davis, J and Newbury, D, Microscopy and Microanalysis 14 (2008), p. 1176.Google Scholar