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Electrostatic-Potential Analysis of Charged Particles by Split-Illumination Electron Holography

Published online by Cambridge University Press:  23 September 2015

Toshiaki Tanigaki ,
Zentaro Akase ,
Shinji Aizawa ,
Hyun Soon Park ,
Yasukazu Murakami ,
Daisuke Shindo  and
Hiromitsu Kawase
Toshiaki Tanigaki
Affiliation:
Central Research Laboratory, Hitachi, Ltd., Hatoyama 350-0395, Japan Center for Emergent Matter Science (CEMS), RIKEN, Wako 351-0198, Japan
Zentaro Akase
Affiliation:
Center for Emergent Matter Science (CEMS), RIKEN, Wako 351-0198, Japan Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577, Japan
Shinji Aizawa
Affiliation:
Center for Emergent Matter Science (CEMS), RIKEN, Wako 351-0198, Japan
Hyun Soon Park
Affiliation:
Department of Materials Science & Engineering, Dong-A University, Busan 604-714, Republic of Korea
Yasukazu Murakami
Affiliation:
Center for Emergent Matter Science (CEMS), RIKEN, Wako 351-0198, Japan Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577, Japan
Daisuke Shindo
Affiliation:
Center for Emergent Matter Science (CEMS), RIKEN, Wako 351-0198, Japan Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577, Japan
Hiromitsu Kawase
Affiliation:
System Research & Development Center, Ricoh Institute of Technology, RICOH Co., Ltd., Kanagawa 224-0035, Japan

Abstract

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Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1969 - 1970
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Matteucci, G., et al., J. Appl. Phys. 69 (1991). p 1835.CrossRefGoogle Scholar
[2] Shirai, M., et al., Ultramicroscopy 146 (2014). p 125.CrossRefGoogle Scholar
[3] Tanigaki, T., et al., Appl. Phys. Lett. 101 (2012) 043101.CrossRefGoogle Scholar
[4] Tanigaki, T., et al., Appl. Phys. Lett. 104 (2014) 131601.CrossRefGoogle Scholar
[5] This research was partly supported by a grant from the Japan Society for the Promotion of Science (JSPS) through the "Funding Program for World-Leading Innovative R&D on Science and Technology (FIRST Program)" initiated by the Council for Science and Technology Policy (CSTP). This work was partly supported by the Cooperative Research Program of "Network Joint Research Center for Materials and Devices" from the Ministry of Education, Culture, Sports, Science and Technology (MEXT)..Google Scholar