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Electrostatic Force Microscopy: Measuring Ion Mobility, Non-linear Optical Signals and Achieving Ultimate Time Resolution

Published online by Cambridge University Press:  30 July 2020

Peter Grutter
Peter Grutter*
Affiliation:
Department of Physics, McGill University, Montreal, Quebec, Canada

Abstract

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Type
Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens - Complimentary Microwave Interrogation in Surface Analysis
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2984 - 2987
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Copyright
Copyright © Microscopy Society of America 2020

References

Revealing energy level structure by tunneling rate measured by single-electron sensitive electrostatic force spectroscopy Roy-Gobeil, A., Miyahara, Y., and Grutter, P., Nano Lett.15, 2324 (2015)10.1021/nl504468aCrossRefGoogle ScholarPubMed
For a recent review see: Quantum state readout of individual quantum dots by electrostatic force detection Miyahara, Y., Roy-Gobeil, A. and Grutter, Peter, Nanotechnology 28 , 064001 (2017)10.1088/1361-6528/aa5261CrossRefGoogle Scholar
Fully Quantum Mechanical Electron Transfer Observed in a Single Redox Molecule at a Metal Interface Roy-Gobeil, A., Miyahara, Y., Bevan, K.H., and Grutter, P., Nano Lett. 19, 6104 (2019)10.1021/acs.nanolett.9b02032CrossRefGoogle Scholar
Minority carrier lifetime in polycrystalline silicon solar cells studied by photoassisted Kelvin probe force microscopy Takihara, M., Takahashi, T., Ujihara, T., Appl. Phys. Lett. 93, 021902 (2008)10.1063/1.2957468CrossRefGoogle Scholar
Intensity-Modulated Scanning Kelvin Probe Microscopy for Probing Recombination in Organic Photovoltaics Shao, G., Glaz, M. S., Ma, F., Ju, H., Ginger, D. S., ACS Nano 8, 10799 (2014)10.1021/nn5045867CrossRefGoogle ScholarPubMed
The lower limit for time resolution in fm-AFM Schumacher, Z., Spielhofer, A., Miyahara, Y., Grutter, P., Appl. Phys. Lett. 110, 053111 (2017)10.1063/1.4975629CrossRefGoogle Scholar
Collective ionic transport phenomena in lithium battery cathodes: linking experiment and theory Mascaro, A., Wang, Z., Hovington, P., Miyahara, Y., Paolella, A., Gariepy, V., Feng, Z., Enright, T., Aiken, C., Zaghib, K., Bevan, K.H., and Grutter, P. Nano Lett. 17 , 4489 (2017)10.1021/acs.nanolett.7b01857CrossRefGoogle Scholar
for a recent review see: Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements Mascaro, A., Miyahara, Y., Enright, T., Dagdeviren, O.E., and Grutter Beilstein, P. J. Nanotechnology 10, 617-633 (2019)Google Scholar
Nanoscale force sensing of ultrafast light induced polarization in dielectrics Schumacher, Z., Rejali, R., Pachlatko, R., Spielhofer, A., Miyahara, Y., Cooke, D.G., and Grutter, P. under reviewGoogle Scholar