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Electron Probe Micro-Analysis at Low Accelerating Voltages: The Impacts of Surface Coatings and Oxide Layers on Quantification

Published online by Cambridge University Press:  01 August 2018

M. B. Matthews ,
S.L. Kearns  and
B. Buse
M. B. Matthews
Affiliation:
AWE, Reading, UK University of Bristol, Bristol, UK
S.L. Kearns
Affiliation:
University of Bristol, Bristol, UK
B. Buse
Affiliation:
University of Bristol, Bristol, UK

Abstract

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Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 738 - 739
Copyright
© Microscopy Society of America 2018 

References

[1] Matthews, MB., Keans, S.L. Buse, B. Microsc. Microanal. 22 2016) p. 418.Google Scholar
[2] Siekhaus, W. Nelson, A. Materials Research Society, Fall 2005, UCRL-PROC-217595 2005) p. 8.Google Scholar
[3] Waldo, R.A. in Microbeam Analysis (ed. D.E. Newbury San Francisco p. 310.Google Scholar
[4] Llovet, X. Salvat, F. IOP Conf. Ser. Mater. Sci. Eng. 109 2016) p. 12009.Google Scholar
[5] The authors thank AWE for funding this project.Google Scholar