Hostname: page-component-848d4c4894-5nwft Total loading time: 0 Render date: 2024-05-14T05:09:54.108Z Has data issue: false hasContentIssue false
  • English
  • Français

Electron Diffraction-Based Quality Evaluation of Graphene Films

Published online by Cambridge University Press:  27 August 2014

Kai Cui ,
Ken Bosnick ,
Rob Indoe  and
Marek Malac
Kai Cui
Affiliation:
National Institute for Nanotechnology, Edmonton, Canada
Ken Bosnick
Affiliation:
National Institute for Nanotechnology, Edmonton, Canada
Rob Indoe
Affiliation:
National Institute for Nanotechnology, Edmonton, Canada
Marek Malac
Affiliation:
National Institute for Nanotechnology, Edmonton, Canada Department of Physics, University of Alberta, Edmonton, Canada

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1786 - 1787
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Suk, JW, et al, ACS Nano 5 (2011), p. 6916.Google Scholar
[2] Mitchell, DRG Micros Res Tech 71 (2008), p. 588.Google Scholar
[3] Mattson, , et al, ACS Nano 5 (2011), p. 9710.Google Scholar
[4] Chuvillin, A, et al, New J Phys 11 (2009), p. 083019.Google Scholar
[5] Jin, C, et al, Phys Rev Lett 102 (2009), p. 205501.Google Scholar