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Electron Correlation Microscopy for Studying Fluctuating Systems In Situ

Published online by Cambridge University Press:  05 August 2019

Debaditya Chatterjee ,
Pei Zhang  and
Paul M. Voyles
Debaditya Chatterjee
Affiliation:
Department of Materials Science & Engineering, University of Wisconsin-Madison, Madison, WI, USA.
Pei Zhang
Affiliation:
Department of Materials Science & Engineering, University of Wisconsin-Madison, Madison, WI, USA.
Paul M. Voyles*
Affiliation:
Department of Materials Science & Engineering, University of Wisconsin-Madison, Madison, WI, USA.
*
*Corresponding author: paul.voyles@wisc.edu

Abstract

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Type
In situ TEM Characterization of Dynamic Processes During Materials Synthesis and Processing
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1520 - 1521
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]He, L et al. , Microscopy and Microanalysis 21 (2015), p. 1026.Google Scholar
[2]Zhang, P et al. , Ultramicroscopy 178 (2017), p. 125.Google Scholar
[3]Zhang, P et al. , Nature Communications 9 (2018), p. 1129.Google Scholar
[4]Development of ECM was supported by the National Science Foundation (DMR-1807241). Development of advanced detectors and microscopy facilities are supported by the Wisconsin MRSEC (DMR-1728933).Google Scholar