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Electron Channelling Contrast Imaging in a Low Voltage Scanning Electron Microscope

Published online by Cambridge University Press:  05 August 2019

G. Naresh-Kumar ,
C. Trager-Cowan  and
K. P. Mingard
G. Naresh-Kumar*
Affiliation:
Department of Physics, SUPA, University of Strathclyde, Glasgow G4 0NG, UK
C. Trager-Cowan
Affiliation:
Department of Physics, SUPA, University of Strathclyde, Glasgow G4 0NG, UK
K. P. Mingard
Affiliation:
National Physical Laboratory, Middlesex, TW11 0LW, UK
*
*Corresponding author: naresh.gunasekar@strath.ac.uk

Abstract

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Type
Low Voltage, Low Energy Electron Microscopy Imaging and Analysis
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 504 - 505
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Picard, Y.N. et al. , Appl. Phys. Let. 90, (2007) p. 234101Google Scholar
[2]Naresh-Kumar, G. et al. Phys. Rev. Lett., 108, (2012) p. 135503.Google Scholar
[3]Kumagi, K. and Sekiguchi, T. Ultramicroscopy, 109, (2009) p. 368.Google Scholar
[4]The authors acknowledge support from the EPSRC grant; “Quantitative non-destructive nanoscale characterisation of advanced materials” (EP/P015719/1).Google Scholar