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Electron Beam Induced Current Characterization of Dark Line Defects in Failed and Degraded High Power Quantum Well Laser Diodes

Published online by Cambridge University Press:  01 August 2010

M Mason ,
N Presser ,
Y Sin ,
B Foran  and
SC Moss
M Mason
Affiliation:
The Aerospace Corporation
N Presser
Affiliation:
The Aerospace Corporation
Y Sin
Affiliation:
The Aerospace Corporation
B Foran
Affiliation:
The Aerospace Corporation
SC Moss
Affiliation:
The Aerospace Corporation

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 794 - 795
Copyright
Copyright © Microscopy Society of America 2010