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Electron Backscatter Diffraction Characterization of Nanostructured Thermoelectric Materials

Published online by Cambridge University Press:  23 November 2012

M. Nowell
Affiliation:
EDAX-TSL, Draper, UT
J. Beck
Affiliation:
TXL Group Inc., El Paso, TX
M. Alvarado
Affiliation:
TXL Group Inc., El Paso, TX
D. Nemir
Affiliation:
TXL Group Inc., El Paso, TX
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Copyright
Copyright © Microscopy Society of America 2012

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