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Electric Field-Induced Surface Melting of Gold Observed In Situ at Room Temperature and at Atomic Resolution Using TEM

Published online by Cambridge University Press:  05 August 2019

Ludvig de Knoop ,
Mikael Juhani Kuisma ,
Joakim Löfgren ,
Kristof Lodewijks ,
Mattias Thuvander ,
Paul Erhart ,
Alexandre Dmitriev  and
Eva Olsson
Ludvig de Knoop*
Affiliation:
Chalmers University of Technology, Department of Physics, Gothenburg, Sweden.
Mikael Juhani Kuisma
Affiliation:
University of Jyväskylä, Department of Chemistry, Jyväskylä, Finland.
Joakim Löfgren
Affiliation:
Chalmers University of Technology, Department of Physics, Gothenburg, Sweden.
Kristof Lodewijks
Affiliation:
Chalmers University of Technology, Department of Physics, Gothenburg, Sweden.
Mattias Thuvander
Affiliation:
Chalmers University of Technology, Department of Physics, Gothenburg, Sweden.
Paul Erhart
Affiliation:
Chalmers University of Technology, Department of Physics, Gothenburg, Sweden.
Alexandre Dmitriev
Affiliation:
University of Gothenburg, Department of Physics, Gothenburg, Sweden.
Eva Olsson*
Affiliation:
Chalmers University of Technology, Department of Physics, Gothenburg, Sweden.
*
*Corresponding authors: ludvig.deknoop@chalmers.se and eva.olsson@chalmers.se
*Corresponding authors: ludvig.deknoop@chalmers.se and eva.olsson@chalmers.se

Abstract

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Type
In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1830 - 1831
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Frenken, J. W. M. and van der Veen, J. F., Phys. Rev. Lett. 54 (1985), p. 134.Google Scholar
[2]de Knoop, L et al. , Physical Review Materials 2 (2018), p. 085006.Google Scholar