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Elastic Anomaly for SrTiO3 Thin Films Grown on Si(001)

Published online by Cambridge University Press:  01 August 2004

J.C. Woicik ,
F.S. Aguirre-Tostado ,
A. Herrera-Gomez ,
R. Droopad ,
Z. Yu ,
D.G. Schlom ,
P. Zschack ,
E. Karapetrova  and
C.S. Hellberg
J.C. Woicik
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland
F.S. Aguirre-Tostado
Affiliation:
CINVESTAV, Mexico
A. Herrera-Gomez
Affiliation:
CINVESTAV, Mexico
R. Droopad
Affiliation:
Motorola, Temple, Arizona
Z. Yu
Affiliation:
Motorola, Temple, Arizona
D.G. Schlom
Affiliation:
Pennsylvania State University
P. Zschack
Affiliation:
University of Illinois
E. Karapetrova
Affiliation:
University of Illinois
C.S. Hellberg
Affiliation:
Naval Research Laboratory, Washington, DC
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 826 - 827
Copyright
© 2004 Microscopy Society of America

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