The atomic force microscope (AFM) is a powerful tool for probing surface topography, in addition to chemical and mechanical properties of surfaces. To investigate the chemical properties of a sample, force measurements are made between the AFM's “molecular finger,” or probe, and the sample. Force measurements can be made in many environmental conditions, which makes the AFM a versatile technique. However, in ambient conditions most samples are covered by a thin layer of water. When the AFM probe comes into contact with the thin water layer, a capillary bridge forms between the AFM probe and sample. Because of this water layer, it is believed that in ambient conditions a non-surface specific capillary force dominates the adhesive force between the AFM probe and sample. The non-surface specific capillary force should obscure any information about the surface. Currently, we are studying to what extent the capillary forces are non-surface specific and what influence this has on pull-off-force measurements.