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The Effect of the Ion Beam Energy on M-plane InGaN Layer Preparation for STEM
Published online by Cambridge University Press: 05 August 2019
Abstract
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- Type
- Revealing the Fundamental Structure of Soft and Hard Matter by Minimizing Beam-Sample Interactions
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- Copyright
- Copyright © Microscopy Society of America 2019
References
[4]Wang, X.. (2018), Characterization of InGaN thin Films and Nanowires by Analytical Transmission Electron Microscopy (Doctoral dissertation). Retrieved from http://etheses.whiterose.ac.uk/21255/.Google Scholar
[6]T. Nguyen, Y. Cao, B. Dzuba, A. Senichev, O. Malis, and M. Manfra acknowledge funding from the National Science Foundation. TN, YC, and OM acknowledge partial support from NSF grant ECCS-1253720, and DMR-1610893. AS and BD were supported from NSF award ECCS-1607173.Google Scholar