Hostname: page-component-7479d7b7d-q6k6v Total loading time: 0 Render date: 2024-07-11T07:29:26.560Z Has data issue: false hasContentIssue false
  • English
  • Français

Dynamic Observation of Li-ion movement in a Solid-State Li-Ion Battery

Published online by Cambridge University Press:  05 August 2019

Yuki Nomura ,
Kazuo Yamamoto ,
Tsukasa Hirayama ,
Emiko Igaki  and
Koh Saitoh
Yuki Nomura*
Affiliation:
Technology Innovation Division, Panasonic Corporation, Moriguchi, Osaka, Japan. Department of Crystalline Materials Science, Nagoya University, Nagoya, Aichi, Japan.
Kazuo Yamamoto
Affiliation:
Nanostructures Research Laboratory, Japan Fine Ceramics Center, Nagoya, Aichi, Japan.
Tsukasa Hirayama
Affiliation:
Nanostructures Research Laboratory, Japan Fine Ceramics Center, Nagoya, Aichi, Japan.
Emiko Igaki
Affiliation:
Technology Innovation Division, Panasonic Corporation, Moriguchi, Osaka, Japan.
Koh Saitoh
Affiliation:
Institute of Materials and Systems for Sustainability, Nagoya University, Nagoya, Aichi, Japan.
*
*Corresponding author: nomura.yuki001@jp.panasonic.com

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
In situ TEM Characterization of Dynamic Processes During Materials Synthesis and Processing
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1436 - 1437
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Nomura, Y et al. , Nano Lett. 18 (2018), p. 5892.Google Scholar
[2]Iriyama, Y et al. , Electrochem. Commun. 8 (2006), p. 1287.Google Scholar
[3]This work was partly supported by the Japan Society for the Promotion of Science, Grant-in-Aid for Scientific Research KAKENHI (JP 17H02792) and Nagoya University microstructural characterization platform as a program of the “Nanotechnology Platform”. We are grateful to Prof. Shunsuke Muto and Dr. Jun Kikkawa for their valuable discussion on STEM-EELS analysis.Google Scholar