Hostname: page-component-848d4c4894-2xdlg Total loading time: 0 Render date: 2024-06-24T14:19:59.958Z Has data issue: false hasContentIssue false
  • English
  • Français

Dual-beam Focused Ion Beam: A Multifunctional Tool for Nanotechnology

Published online by Cambridge University Press:  01 November 2002

N. Yao ,
E. Kung ,
S. Allameh  and
W. O. Soboyejo
N. Yao
Affiliation:
Princeton University, Princeton Materials Institute, Princeton, NJ 08540
E. Kung
Affiliation:
Princeton University, Princeton Materials Institute, Princeton, NJ 08540
S. Allameh
Affiliation:
Princeton University, Princeton Materials Institute, Princeton, NJ 08540
W. O. Soboyejo
Affiliation:
Princeton University, Princeton Materials Institute, Princeton, NJ 08540

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 56 - 57
Copyright
Copyright © Microscopy Society of America 2002