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Dopant and Interfacial Analysis of Epitaxial CdTe Using Atom Probe Tomography

Published online by Cambridge University Press:  23 September 2015

George L. Burton ,
David R. Diercks  and
Brian P. Gorman
George L. Burton
Affiliation:
Metallurgical and Materials Engineering, Colorado School of Mines, Golden, CO.
David R. Diercks
Affiliation:
Metallurgical and Materials Engineering, Colorado School of Mines, Golden, CO.
Brian P. Gorman
Affiliation:
Metallurgical and Materials Engineering, Colorado School of Mines, Golden, CO.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 693 - 694
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Martin, A., Green, , et al, Prog. Photovolt.: Res. Appl 22 (2014). p. 701.Google Scholar
[2] Girish Kumar, S. & Rao, K.S.R. Koteswara, Energy Environ. Sci. 7 (2014). p. 45.CrossRefGoogle Scholar
[3] Gorman, B. P., et al., Microscopy Today 16 (2008). p. 42.CrossRefGoogle Scholar
[4] The authors acknowledge funding from the Department of Energy's SunShot Foundational Program to Advance Cell Efficiency (F-PACE II)..Google Scholar