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Dislocation Characterization using Weak Beam Dark Field STEM Imaging

Published online by Cambridge University Press:  01 August 2018

J. Miao ,
S. Singh ,
J. Tessmer ,
M. Shih ,
M. Ghazisaeidi ,
M. DeGraef  and
M. J. Mills
J. Miao
Affiliation:
Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OH. Department of Materials Science and Engineering, The Ohio State University, Columbus, OH.
S. Singh
Affiliation:
Department of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh, PA.
J. Tessmer
Affiliation:
Department of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh, PA.
M. Shih
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, OH.
M. Ghazisaeidi
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, OH.
M. DeGraef
Affiliation:
Department of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh, PA.
M. J. Mills
Affiliation:
Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OH. Department of Materials Science and Engineering, The Ohio State University, Columbus, OH.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 2202 - 2203
Copyright
© Microscopy Society of America 2018 

References

[1] Phillips, P.J., Mills, M.J. De Graef, M. Philosophical Magazine 91 2011) p. 2081.Google Scholar
[2] Cockayne, D.J.H., Ray, I. L.F. Whelan, M. J. Philosophical Magazine A 20 1969) p. 1265.Google Scholar
[3] Iwata, H. Saka, H. Philosophical Magazine Letters 97 2017) p. 74.Google Scholar
[4] Miao, J., et al, Acta Materialia 132 2017) p. 35.Google Scholar
[5] The authors acknowledge financial supports from The National Science Foundation, Division of Materials Research under contract # #DMR-60050072.Google Scholar