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Direct Observations of Retention Failure in Ferroelectric Memories by in situ Transmission Electron Microscopy

Published online by Cambridge University Press:  23 November 2012

P. Gao ,
C. Nelson ,
J. Jokisaari ,
Y. Zhang ,
X. Pan ,
S. Baek ,
C. Bark  and
C. Eom
P. Gao
Affiliation:
University of Michigan, Ann Arbor, MI
C. Nelson
Affiliation:
University of Michigan, Ann Arbor, MI
J. Jokisaari
Affiliation:
University of Michigan, Ann Arbor, MI
Y. Zhang
Affiliation:
University of Michigan, Ann Arbor, MI
X. Pan
Affiliation:
University of Michigan, Ann Arbor, MI
S. Baek
Affiliation:
University of Wisconsin-Madison, Madison, WI
C. Bark
Affiliation:
University of Wisconsin-Madison, Madison, WI
C. Eom
Affiliation:
University of Wisconsin-Madison, Madison, WI
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1846 - 1847
Copyright
Copyright © Microscopy Society of America 2012

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