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Development of a Philips cryo-TEM provided with a liquid helium cooled tilt stage and a vacuum transfer system

Published online by Cambridge University Press:  02 July 2020

R. Wagner ,
A.F. de Jong ,
A.G. Koster ,
R. Morrison ,
F. Tothill  and
U. Lücken
R. Wagner
Affiliation:
Philips Electron Optics, P.O. Box 218, 5600, MD, Eindhoven, The Netherlands.
A.F. de Jong
Affiliation:
Philips Electron Optics, P.O. Box 218, 5600, MD, Eindhoven, The Netherlands.
A.G. Koster
Affiliation:
Philips Electron Optics, P.O. Box 218, 5600, MD, Eindhoven, The Netherlands.
R. Morrison
Affiliation:
Philips Electron Optics, P.O. Box 218, 5600, MD, Eindhoven, The Netherlands.
F. Tothill
Affiliation:
Philips Electron Optics, P.O. Box 218, 5600, MD, Eindhoven, The Netherlands.
U. Lücken
Affiliation:
Philips Electron Optics, P.O. Box 218, 5600, MD, Eindhoven, The Netherlands.
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Extract

In order to reduce beam damage, biological TEM specimens are often observed at temperatures close to the boiling point of liquid nitrogen (77 K). Recently, encouraging results on single particles as well as on 2D crystals have appeared, derived from images taken near liquid helium temperature (4 K), in dedicated TEMs. At these temperatures the high resolution frequencies are much better preserved, increasing the allowable dose and thus the signal to noise ratio.4 Here we present the design of a new dedicated Philips He-TEM which combines the full functionality of a CM300 TWIN with a vacuum transfer system and a liquid helium cooled specimen holder.

A schematic overview of the Cryo-TEM is shown in figure 1. The key differences compared to a standard CM microscope are: 1) The tip of the specimen rod is cooled below 10 K and the rod itself cannot be taken out of the goniometer (CompuStage). 2) The specimen enters the column on the opposite side.

Type
Advances in Instrumentation and Performance
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 400 - 401
Copyright
Copyright © Microscopy Society of America

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References

1.Hebert, H. et al., proc. EUREM conf. Dublin (1996).Google Scholar
2.Orlova, E.V. et al., proc. EUREM conf. Dublin (1996).Google Scholar
3.Fujiyoshi, Y. et al., Ultramicroscopy 38 (1991) 241.CrossRefGoogle Scholar
4.Stark, H. et al., Ultramicroscopy 63 (1996) 75.Google Scholar