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Developing Multifunctional and High Resolution In-situ TEM Holders

Published online by Cambridge University Press:  05 August 2019

Songhua Cai ,
Mingjie Xu ,
Sheng Dai ,
Peng Wang  and
Xiaoqing Pan
Songhua Cai
Affiliation:
National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences and Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing, China.
Mingjie Xu
Affiliation:
Department of Materials Science and Engineering, University of California - Irvine, Irvine, CA, USA.
Sheng Dai
Affiliation:
Department of Materials Science and Engineering, University of California - Irvine, Irvine, CA, USA.
Peng Wang
Affiliation:
National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences and Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing, China.
Xiaoqing Pan
Affiliation:
Department of Materials Science and Engineering, University of California - Irvine, Irvine, CA, USA. Department of Physics and Astronomy, University of California - Irvine, Irvine, CA, USA.

Abstract

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Type
In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1854 - 1855
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Boston, R., et al. , Science 344 (2014), p. 623.Google Scholar
[2]Espinosa, H.D., et al. , Small 8 (2012), p. 3233.Google Scholar
[3]Cai, S.H., et al. , Ultramicroscopy 194 (2018), p. 57.Google Scholar
[4]Xu, M.J., et al. , Ultramicroscopy 192 (2018), p. 1.Google Scholar
[5]Wang, M., et al. , Nature Electronics 1 (2018), p. 130.Google Scholar