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Determination of the Effective EDS Detector Area Using Experimental and Theoretical X-ray Emission Yields

Published online by Cambridge University Press:  23 September 2015

Mathias Procop
Affiliation:
BAM Federal Institute for Materials Research and Testing, Division 6.8 Surface Analysis and Interfacial Chemistry, Berlin, Germany present address: IfG-Institute for Scientific Instruments, 12489 Berlin, Germany
Vasile-Dan Hodoroaba
Affiliation:
BAM Federal Institute for Materials Research and Testing, Division 6.8 Surface Analysis and Interfacial Chemistry, Berlin, Germany
Ralf Terborg
Affiliation:
Bruker Nano GmbH, 12489 Berlin, Germany

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] ISO 15632:2012, ISO: Geneva.Google Scholar
[2] Green, M, , M & Cosslet, V E, Br. J. Appl. Phys. (J. Phys. D) 2(1) (1968), p. 425.Google Scholar
[3] Lifshin, E, Ciccarelli, M F & Bolon, R (1980), in: Proceedings of 8th ICXOM (Boston, August 18-24) (Pendell, Midland, MI, USA), p. 141.Google Scholar
[4] Joy, D C, J. Microsc 191(1) (1998), p 74.Google Scholar
[5] Procop, M, Microsc. Microanal 10 (2004), p. 481.Google Scholar
[6] Bote, D, Salvat, F, Jablonski, A & Powell, C J At. Data and Nucl. Data Tables 96 871 and ibid. 97 186, NIST Standard Reference Database 164 (2009 & 2011).CrossRefGoogle Scholar
[7] Casnati, E, Tartari, A & Baraldi, C, J Phys B 15 (1982), p. 155.CrossRefGoogle Scholar