Hostname: page-component-84b7d79bbc-g7rbq Total loading time: 0 Render date: 2024-07-26T03:47:36.474Z Has data issue: false hasContentIssue false
  • English
  • Français

Determination of Mean Free Path for Inelastic Scattering in Poly(2-Vinyl Pyridine) by Low-Loss Spectrum Imaging

Published online by Cambridge University Press:  02 July 2020

A. Aitouchen ,
T. Chou ,
M. Libera  and
M. Misra
A. Aitouchen
Affiliation:
Stevens Institute of Technology, Hoboken, NJ;
T. Chou
Affiliation:
Stevens Institute of Technology, Hoboken, NJ;
M. Libera
Affiliation:
Stevens Institute of Technology, Hoboken, NJ;
M. Misra
Affiliation:
Unilever Research, Edgewater, NJ
Get access

Extract

The common experimental method to determine the total inelastic mean free path i by electron energy-loss spectroscopy (EELS) is by the relation : t/λi= ln(It/IO) [1] where t is the specimen thickness, It, is the total integrated intensity, and Io is the intensity of the zero-loss peak. The accuracy of this measurement depends on the thickness determination. Model geometries like cubes, wedges, and spheres enable accurate thickness determination from transmission images.

Spherical polymers with diameters of order 10-200nm can be made from a number of high-Tg polymers by solvent atomization. This research studied atomized spheres of poly(2-vinyl pyridine) [PVP]. A solution of 0.1% PVP in THF was nebulized. After solvent evaporation during free fall within the chamber atmosphere, solid spherical polymer particles with a range of diameters were collected on holey-carbon TEM grids at the bottom of the atomization chamber.

Type
Electron Energy-Loss Spectroscopy (EELS) and Imaging
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 224 - 225
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1]Leapman, R. D., Fiori, C.E. and Swyt, C.R., J. Microscopy 133 (1984) 239.CrossRefGoogle Scholar
[2]Hunt, J. A., Williams, D.B., Ultramicroscopy, 38 (1991) 47–73.CrossRefGoogle Scholar
[3]Egerton, R., Electron Energy Loss Spectroscopy in the Electron Microscope, Plenum, (1986).Google Scholar
[4]Ritsko, J. and Bigelow, R.W., J. Chem. Phys. 69 (1987), 4162–4170.CrossRefGoogle Scholar
[5]Wang, Y., Chou, T., Libera, M., Voelkl, E., and B. Frost Microsc. Microanal. 4 (1998) 146–157.CrossRefGoogle Scholar
[6] This research was supported by Unilever Research and the Army Research Office.Google Scholar