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Design and Construction of a Quantitative Uniaxial Straining Stage For The Environmental SEM

Published online by Cambridge University Press:  02 July 2020

John F. Mansfield ,
Michael D. Thouless ,
Justin A. Stefano  and
Judd Holbrook
John F. Mansfield
Affiliation:
North Campus Electron Microbeam Analysis Laboratory 417 SRB, University of Michigan, 2455 Hayward, Ann Arbor, MI 48109-2143 http://emalwww.engin.umich.edu/people/jfmjfin/
Michael D. Thouless
Affiliation:
North Campus Electron Microbeam Analysis Laboratory 417 SRB, University of Michigan, 2455 Hayward, Ann Arbor, MI 48109-2143 http://emalwww.engin.umich.edu/people/jfmjfin/
Justin A. Stefano
Affiliation:
North Campus Electron Microbeam Analysis Laboratory 417 SRB, University of Michigan, 2455 Hayward, Ann Arbor, MI 48109-2143 http://emalwww.engin.umich.edu/people/jfmjfin/
Judd Holbrook
Affiliation:
North Campus Electron Microbeam Analysis Laboratory 417 SRB, University of Michigan, 2455 Hayward, Ann Arbor, MI 48109-2143 http://emalwww.engin.umich.edu/people/jfmjfin/
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Extract

The environmental scanning electron microscope (or Environmental SEM) is a powerful tool in the materials science laboratory. The large sample chamber and ability to operate in a very poor vacuum (>5Torr) makes it an ideal device for a wide variety of in-situ studies. A three point bending stage has been used in the ElectroScan E3 environmental SEM at the University of Michigan for over four years. The stage is extremely flexible and can be used to view samples in both planar and transverse views. It also allows for quantitative recording of the stress and strain exerted on the sample via a load cell and a linear variable differential transducer. The output s of the load cell are acquired into an Apple Macintosh computer via a National Instruments analog-to-digital acquisition card. To extend the capability of EMAL's in-situ tensile testing laboratory, a uniaxial tensile stage has been constructed in collaboration with the Department of Mechanical Engineering and Applied Mechanics.

Type
New Trends in Scanning Electron Microscopy and Microanalysis
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 268 - 269
Copyright
Copyright © Microscopy Society of America

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References

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