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Depth Profiling Magnetic Structure Using Scanning Electron Microscopy with Polarization Analysis (SEMPA)

Published online by Cambridge University Press:  01 August 2010

B McMorran ,
D Pierce  and
J Unguris
B McMorran
Affiliation:
National Institute of Standards and Technology
D Pierce
Affiliation:
National Institute of Standards and Technology
J Unguris
Affiliation:
National Institute of Standards and Technology

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1862 - 1863
Copyright
Copyright © Microscopy Society of America 2010