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Denoising Electron-energy Loss Data Using Non-local Means Filters

Published online by Cambridge University Press:  04 August 2017

Niklas Mevenkamp
Affiliation:
AICES Graduate School, RWTH Aachen University, Aachen, Germany
Benjamin Berkels
Affiliation:
AICES Graduate School, RWTH Aachen University, Aachen, Germany
Martial Duchamp
Affiliation:
School of Materials Science and Engineering, Nanyang Technological University, Singapore

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2017 

References

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