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Demonstration of 40kV TEM Diffraction of Graphite for Structural Analysis

Published online by Cambridge University Press:  23 September 2015

Andrew Barnum  and
Jun Jiao
Andrew Barnum
Affiliation:
Physics Department, Portland State University, Portland, OR 97201, USA
Jun Jiao
Affiliation:
Physics Department, Portland State University, Portland, OR 97201, USA Mechanical and Materials Engineering, Portland State University, Portland, OR 97207, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 353 - 354
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Stoger-Pollach, M. ""A Short Note on How to Convert a Conventional Analytical TEM into an Analytical Low Voltage TEM.". Ultramicroscopy, 2014) 94–97.Google Scholar
[2] Marcus, Yizhak. ""Solubility of C60 Fullerene.". Journal of Physical Chemistry B no. 13 (2001) 2499–2506.Google Scholar
[3] http://www.2spi.com/catalog/grids/lacey-carbon-formvar.html. Accessed Jan 15th, 2015..Google Scholar
[4] Vainshtein, B. K. Jtructure Analysis by Electron Diffraction. Burlington: Elsevier Science, 1964.Google Scholar