No CrossRef data available.
Article contents
Demonstration of 40kV TEM Diffraction of Graphite for Structural Analysis
Published online by Cambridge University Press: 23 September 2015
Abstract
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
![Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'](https://static.cambridge.org/content/id/urn%3Acambridge.org%3Aid%3Aarticle%3AS1431927615002561/resource/name/firstPage-S1431927615002561a.jpg)
- Type
- Abstract
- Information
- Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 353 - 354
- Copyright
- Copyright © Microscopy Society of America 2015
References
[1]
Stoger-Pollach, M. ""A Short Note on How to Convert a Conventional Analytical TEM into an Analytical Low Voltage TEM.". Ultramicroscopy, 2014) 94–97.Google Scholar
[2]
Marcus, Yizhak. ""Solubility of C60 Fullerene.". Journal of Physical Chemistry B
no. 13 (2001) 2499–2506.Google Scholar
[3]
http://www.2spi.com/catalog/grids/lacey-carbon-formvar.html. Accessed Jan 15th, 2015..Google Scholar
[4]
Vainshtein, B. K.
Jtructure Analysis by Electron Diffraction. Burlington: Elsevier
Science, 1964.Google Scholar