Hostname: page-component-5c6d5d7d68-vt8vv Total loading time: 0.001 Render date: 2024-08-06T11:31:57.389Z Has data issue: false hasContentIssue false
  • English
  • Français

Defects in Pseudo-Orthorhombic Anorthite on Basal Sapphire

Published online by Cambridge University Press:  02 July 2020

Zhigang Mao ,
Matthew. T. Johnson  and
C. Barry Carter
Zhigang Mao
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota421 Washington Ave. S. E., Minneapolis, MN, 55455-0132
Matthew. T. Johnson
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota421 Washington Ave. S. E., Minneapolis, MN, 55455-0132
C. Barry Carter
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota421 Washington Ave. S. E., Minneapolis, MN, 55455-0132
Get access

Extract

Crystallization of intergranular glass films can influence the performance of ceramic materials [1]. The crystallization of anorthite glass films has been studied in situ in the transmission electron microscope (TEM) [2]. The films are grown by pulsed-laser deposition (PLD) on sapphire (α-AI2O3) substrates. These substrates can be pre-thinned to electron transparency, so that contamination or microstructural damage of the TEM specimen due to the thinning process can be eliminated. This process also allows the microstructure of the glass films to be characterized before crystallization; the evolution of specific features of the film can then be tracked through repeated heat treatments. Prior to the crystallization of the anorthite glass films, observations confirmed that all the glass films deposited by PLD are indeed amorphous. Crystallization experiments were performed in a Philips CM30 TEM equipped with a Gatan single-tilt heating holder. Each specimen was heated in the microscope to a temperature of about 1200 °C at a heating rate of about 30 °C/min. and held at this temperature for 20 minutes.

Type
Microscopy of Ceramics and Minerals
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 592 - 593
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

References:

1.Clarke, D. R. and Gee, M. L., Materials Interfaces: Atomic-Level Structure and Properties (edited by Wolf, D. and Yip, S.), Chapman & Hall London, (1992)255Google Scholar
2.Mallamaci, M. P., Bentley, J., and Carter, C. B., Acta Mater., in the pressGoogle Scholar
3.Davis, G.L. and Tuttle, O. F., Amer. J. Set, Bowen Vol. (1952)107Google Scholar
4. This research is supported by the U. S. DoE under Grant No. DE-FG02-92ER45645Google Scholar