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Defects in Heavy-Ion Bombarded Compound Semiconductors Due to the Elastic and Inelastic Energy Loss Regimes

Published online by Cambridge University Press:  09 October 2013

A.S. Khalil ,
L.T. Chadderton ,
A.M. Stewart ,
D.J. Llewellyn ,
M.C. Ridgway  and
A.P. Byrne
A.S. Khalil
Affiliation:
L.T. Chadderton
Affiliation:
A.M. Stewart
Affiliation:
D.J. Llewellyn
Affiliation:
M.C. Ridgway
Affiliation:
A.P. Byrne
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 1994 - 1995
Copyright
Copyright © Microscopy Society of America 2013