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Deep Learning for Atomically Resolved Imaging

Published online by Cambridge University Press:  01 August 2018

Maxim Ziatdinov ,
Ondrej Dyck ,
Stephen Jesse  and
Sergei V. Kalinin
Maxim Ziatdinov
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN
Ondrej Dyck
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN
Stephen Jesse
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN
Sergei V. Kalinin
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 60 - 61
Copyright
© Microscopy Society of America 2018 

References

[1] Ziatdinov, M., et al, ACS Nano 11 2017) p 12742.Google Scholar
[2] Ziatdinov, M., et al arXiv:1801.05133 2018.Google Scholar
[3] Zhou, B., et al arXiv:1512.04150 2015.Google Scholar
[4] The work was supported by the U.S. Department of Energy, Office of Science, Materials Sciences and Engineering Division (M.Z., S.V.K.). This research was conducted and partially supported (O. D., S.J.) at the Center for Nanophase Materials Sciences, which is a US DOE Office of Science User Facility.Google Scholar