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Deep Data Mining in a Real Space: Application to Scanning Probe Microscopy Studies on a “Parent” State of a High Temperature Superconductor

Published online by Cambridge University Press:  25 July 2016

Maxim Ziatdinov ,
Artem Maksov ,
Athena Sefat ,
Peter Maksymovich  and
Sergei Kalinin
Maxim Ziatdinov
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Artem Maksov
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Athena Sefat
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Peter Maksymovich
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Sergei Kalinin
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1418 - 1419
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Kalinin, S.V., et al., Nature Mater 14 (2015). p. 973.Google Scholar
[2] Dobigeon, N., et al., IEEE Transactions on Signal Processing 57 (2009). p. 4355.Google Scholar
[3] This research was sponsored by the Division of Materials Sciences and Engineering, BES, DOE. Research was conducted at the Center for Nanophase Materials Sciences, which is a DOE Office of Science User Facility.Google Scholar