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Cryogenic FIB Lift-out as a Preparation Method for Damage-Free Soft Matter TEM Imaging

Published online by Cambridge University Press:  27 August 2014

Christopher Parmenter ,
Michael Fay ,
Cheryl Hartfield ,
Gonzalo Amador  and
Grigore Moldovan
Christopher Parmenter
Affiliation:
Nottingham Nanotechnology and Nanoscience Centre, University of Nottingham, Nottingham, UK
Michael Fay
Affiliation:
Nottingham Nanotechnology and Nanoscience Centre, University of Nottingham, Nottingham, UK
Cheryl Hartfield
Affiliation:
Oxford Instruments Nanoanalysis, Omniprobe Products, Dallas, TX, USA
Gonzalo Amador
Affiliation:
Oxford Instruments Nanoanalysis, Omniprobe Products, Dallas, TX, USA
Grigore Moldovan
Affiliation:
Oxford Instruments Nanoanalysis, High Wycombe, UK

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1224 - 1225
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Giannuzzi, L, et al., in “Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice”, ed. LA Giannuzzi and FA Stevie, (Springer (2005) Chapter 10, p.201-228.Google Scholar
[2] Antoniou, N, et al, Conf. Proc. 38th Int. Symp. Testing and Failure Analysis (2012) p. 399-405.Google Scholar
[3] Many thanks to Dr James Dixon (University of Nottingham, CBS) for supplying the hydrogel samples.Google Scholar